Beilstein J. Nanotechnol.2023,14, 1141–1148, doi:10.3762/bjnano.14.94
work, we demonstrate the development of a multi-resistance reference sample for calibrating resistance measurements in conductiveprobeatomicforcemicroscopy (C-AFM) covering the range from 100 Ω to 100 GΩ. We present a comprehensive protocol for in situ calibration of the whole measurement circuit
: calibration; conductiveprobeatomicforcemicroscopy; measurement protocol; nanoscale; resistance reference; Introduction
Since its introduction thirty years ago by Murrell et al. [1], conductiveprobeatomicforcemicroscopy (C-AFM) has evolved into a unique and powerful technique for measuring local
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Figure 1:
(a) Picture of the resistance reference sample connected to the probe station. (b) Top view of the ...